News
AEHR
--
0.00%
--
Zscaler and Nano Dimension among top tech gainers; Splunk and Pixelworks among losers
Gainers: Zscaler (ZS) +25%. Future FinTech (FTFT) +23%. Aehr Test Systems (AEHR) +22%. Nano Dimension (NNDM) +20%. Kubient (KBNT) +18%.Losers: Splunk (SPLK) -22%. SPI Energy (SPI) -10%. GSI Technology (GSIT) -7%. Pixelworks
Seekingalpha · 1d ago
ZS, SPLK, ARLO and NNOX among midday movers
Gainers: Ever-Glory International (EVK) +260%.Lizhi (LIZI) +89%.Nesco Holdings (NSCO) +60%.Waddell & Reed Financial (WDR) +50%.Enlivex Therapeutics (ENLV) +36%.Priority Technology (PRTH) +35%.Aemetis (AMTX) +24%.Zscaler (ZS) +24%.Aehr Test Systems (AEHR) +24%.Arlo Technologies (ARLO) +21%.Losers: Express
Seekingalpha · 1d ago
CRWD, ZS, WDR and OMER among premarket gainers
Phoenix New Media (FENG) +115%.Lizhi (LIZI) +97% on collaboration with Xpeng MotorsEver-Glory International Group (EVK) +85%.Nesco Holdings (NSCO) +51% after announcing acquisition of Custom Truck One Source for $1.475B.Cyanotech Corporation (CYAN) +42%.Waddell
Seekingalpha · 2d ago
Aehr rallies on $4.3M order for initial FOX-XP test cell
Aehr Test Systems (AEHR) +21.6% PM, received an initial $4.3M order from a new customer, a sensors supplier to a major mobile device manufacturer consisting of a FOX-XP production test and burn-in
Seekingalpha · 2d ago
Aehr Receives $4.3M Order for Initial FOX-XP™ Test Cell for Production Test of Mobile Sensor Devices
Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received an initial $4.3 million order from a new customer that is a supplier of
Benzinga · 2d ago
Is Aehr Test Systems (AEHR) A Good Stock To Buy?
Insider Monkey · 11/27 15:59
Ideanomics and Sunworks among top tech gainers; Workday and Nano Dimension among losers
Gainers: Net Element (NETE) +37%. Sunworks (SUNW) +32%. Ideanomics (IDEX) +25%. CPS Technologies (CPSH) +21%. Canaan (CAN) +21%.Losers: Nano Dimension (NNDM) -24%. Workday (WDAY) -8%. Chindata Group (CD) -7%. Sonos (SONO) -6%. Aehr Test Systems
Seekingalpha · 11/20 19:54
Aehr Test Systems to Participate at Craig-Hallum Alpha Select Virtual Conference on November 17, 2020
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will participate at the Craig-Hallum 11 Annual Alpha Select Virtual Conference on Tuesday, November 17, 2020. Aehr Test President and CEO Gayn Erickson and CFO Ken Spink will be hosting virtual meetings with investors throughout the day.
GlobeNewswire · 11/12 12:30
Aehr Test Systems to Participate at Craig-Hallum Alpha Select Virtual Conference on November 17, 2020
FREEMONT, Calif., Nov. 12, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that it will participate at the Craig-Hallum 11th Annual Alpha Select Virtual Conference on Tuesday, November 17, 2020. Aehr Test President and CEO Gayn Erickson and CFO Ken Spink will be hosting virtual meetings with investors throughout the day.“We look forward to discussing our semiconductor wafer level and singulated die test and burn-in solutions and the markets they serve with investors,” said Mr. Erickson. “Aehr Test provides complete production solutions for improving yield and reliability of semiconductors, and devices such as silicon carbide semiconductors used in electric and hybrid electric vehicles, silicon photonics devices used in data centers and 5G infrastructure, and 2D/3D and other sensors used in mobile and wearable applications, which are expected to be significant revenue drivers for our products this fiscal year and next.”For additional information, or to schedule a virtual meeting with Aehr management, please contact your Craig-Hallum representative, or Aehr’s investor relations firm, MKR Investor Relations, at aehr@mkr-group.com.About Aehr Test Systems Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.Contacts:     Aehr Test SystemsMKR Investor Relations Inc. Ken SpinkTodd Kehrli or Jim Byers Chief Financial OfficerAnalyst/Investor Contact (510) 623-9400 x309 (323) 468-2300  aehr@mkr-group.com
GlobeNewswire · 11/12 12:30
Aehr to Showcase FOX-P(TM) Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P(TM) platform for multi-wafer, die and module test and burn-in systems for high volume production at the Virtual SWTest (Semiconductor Wafer Test) Untethered 2020 Conference and Expo on November 11, 2020.
GlobeNewswire · 11/09 12:30
Aehr to Showcase FOX-P Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11
FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ platform for multi-wafer, die and module test and burn-in systems for high volume production at the Virtual SWTest (Semiconductor Wafer Test) Untethered 2020 Conference and Expo on November 11, 2020. In concert with the conference focus on wafer and die level probing, Aehr Test will be showcasing its FOX-P wafer level, singulated die and module solutions, including its WafterPak™ Contactors and DiePak® Carriers, for test and burn-in of logic, memory, optical and power devices to enhance the reliability of product quality produced by semiconductor manufacturers, with a specific focus on applications in 5G, Data Centers and Electric Vehicles. These key high-growth market segments require new technologies such as Gallium Arsenide (GaS), Gallium Nitride (GaN), Indium Phosphide (InPh) and Silicon Carbide (SiC) that require test and burn-in of every device to achieve the high-level quality standards in mission critical applications.Gayn Erickson, President and CEO of Aehr Test Systems, commented, “We look forward to discussing the unique capabilities of our FOX-P™ family of products, particularly for the silicon carbide and silicon photonic markets where we have added significant new customers who recognize the value of our solutions in achieving success in the validation of their devices.“Our wafer level test and burn-in systems are optimal for reliability qualification in the emerging silicon carbide device market that is expected to grow significantly. The high reliability requirement of SiC in automotive and industrial applications require the necessity of test and burn-in of every device, and a critical capability that only our solution can provide on the market today is the ability to test 100% of the die on a wafer in a single insertion, while providing 100% traceability of pass fail results of each device including exactly what time during the test and burn in cycle the devices failed. This is a critical feature to provide confidence to customers that they are removing all early life failures prior to shipment.“Our systems are able to test 100% of their devices on 4”, 6”, 8” and 12” wafers, and 150ºC burn-in 18 wafers at a time in a single FOX-XP system. We believe our customers are able to save significant costs by burning-in entire wafers at a time versus the high costs associated with burning-in modules. Also, there are significant cost savings as a result of detecting burn-in yield losses at wafer level compared to yield losses detected at the more expensive module level.”The SWTest untethered 2020 Conference will be a one-day virtual conference and expo featuring two keynote speakers, one in the AM and one in the PM; seven technical presentations with live Q&A; and an interactive Expo with live chat. The conference is the only industry conference that focuses on all aspects of semiconductor wafer and die level probe testing, featuring the perfect mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference, but rather a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. Additional information on the conference can be found on the SWTest website at http://www.swtest.org.The solutions Aehr test will feature include: * The FOX family of products, which includes multi-wafer test solutions that are capable of functional test and burn-in/cycling of flash memories, microcontrollers and other leading edge ICs in wafer form before they are assembled into multi-die stacked packages. The FOX systems utilize Aehr Test’s FOX WaferPak Contactors or DiePak® Carriers, which provide a cost effective solution for making electrical contact with a full wafer, panel, singulated die or module in a parallel test and burn-in environment. * The FOX-XP system, available with multiple WaferPakTM Contactors (full wafer test) or multiple DiePak Carriers (singulated die/module test) configurations, is capable of functional test and burn-in/cycling of integrated devices such as 2D and 3D sensors, flash memories, Gallium Nitride (GaN), magnetic sensors, microcontrollers, optical modules, Silicon Carbide (SiC) and other leading-edge ICs in either wafer formfactor, before they are assembled into single or multi-die stacked packages, or in singulated die or module formfactor. About Aehr Test Systems Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTSTM and FOX-PTM families of test and burn-in systems and FOX WaferPakTM Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.Contacts:     Aehr Test SystemsMKR Investor Relations Inc. Vernon RogersTodd Kehrli or Jim Byers E.V.P. of Sales & MarketingAnalyst/Investor Contact (510) 623-9400 x215(323) 468-2300 vrogers@aehr.com     aehr@mkr-group.com
GlobeNewswire · 11/09 12:30
Aehr Receives Initial Order for FOX-XP DiePak(R) Carriers for Mobile Device Sensors with new Optical Output Monitoring and Power Regulation per DUT
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced a design win and an initial order for multiple DiePak Carriers for test and burn-in of its lead customer's next generation 3D sensor modules for mobile devices. The customer will use these Aehr proprietary DiePaks for production qualification, test, and burn-in of these devices prior to volume production orders for additional DiePaks forecasted for later in Aehr's current fiscal year.
GlobeNewswire · 11/05 12:33
Boxlight and MobileIron among tech gainers, while Nano Dimension and Sunworks among losers
Gainers: MobileIron (MOBL) +18%. MICT (MICT) +13%. ZoomInfo Technologies (ZI) +12%. Boxlight (BOXL) +11%.  Aehr Test Systems (AEHR) +10%.Losers: Sunworks (SUNW) -47%. SPI Energy (SPI) -26%. Net Element (NETE) -20%. Nano Dimension (NNDM) -13%. CPS Technologies
Seekingalpha · 09/25 19:03
LAC, GNUS, JE and NNDM among midday movers
Gainers: CBAK Energy Technology (CBAT) +95%.SG Blocks (SGBX) +47%.TAT Technologies (TATT) +33%.Infrastructure and Energy Alternatives (IEA) +29%.Lightbridge (LTBR) +28%.Genius Brands International (GNUS) +21%.NextDecade (NEXT) +19%.Lithium Americas (LAC) +19%.MobileIron (MOBL) +18%.Aehr Test
Seekingalpha · 09/25 16:38
Recap: Aehr Test Systems Q1 Earnings
Shares of Aehr Test Systems (NASDAQ:AEHR) rose 3.5% in after-market trading after the company reported Q1 results.Quarterly Results Earnings per share were down 800.00% year over year to ($0.09), which missed the estimate of ($0.03).Revenue of $2,012,000 decreased by 63.64% from the same period last
Benzinga · 09/24 21:35
Aehr Test Systems misses FQ1 estimates as pandemic pushes out orders
Aehr Test Systems (AEHR) reports fiscal Q1 misses on the top and bottom lines with revenue down 64% Y/Y to $2.01M.The company says Q1 revenue and bookings were negatively impacted by
Seekingalpha · 09/24 20:34
Aehr Test Systems Reports First Quarter Fiscal 2021 Financial Results and Maintains Financial Guidance for Growth and Profitability in Fiscal 2021
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced financial results for its first quarter of fiscal 2021 ended August 31, 2020.
GlobeNewswire · 09/24 20:22
Aehr Test Systems EPS misses by $0.06, misses on revenue
Aehr Test Systems (AEHR): Q1 Non-GAAP EPS of -$0.09 misses by $0.06; GAAP EPS of $0.00.Revenue of $2.01M (-63.7% Y/Y) misses by $1.57M.Shares -2.1%.Press Release
Seekingalpha · 09/24 20:09
Aehr Test Systems Q1 EPS $(0.09) Misses $(0.03) Estimate, Sales $2.01M Miss $3.58M Estimate
Aehr Test Systems (NASDAQ:AEHR) reported quarterly losses of $(0.09) per share which missed the analyst consensus estimate of $(0.03) by 200 percent. This is a 800 percent decrease over losses of $(0.01) per share from
Benzinga · 09/24 20:07
Aehr Test Systems to Host Earnings Call
ACCESSWIRE · 09/24 20:00
Webull provides a variety of real-time AEHR stock news. You can receive the latest news about Aehr Test Sys through multiple platforms. This information may help you make smarter investment decisions.
About AEHR
Aehr Test Systems is engaged in the designing, manufacturing and marketing of advanced test and burn-in products to the semiconductor manufacturing industry. The Company manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures, die carriers and related accessories. The Company's principal products are the Advanced Burn-In and Test System (ABTS), the FOX full wafer contact parallel test and burn-in systems, WaferPak full wafer contactor, the DiePak carrier and test fixtures. The Company develops, manufactures and sells systems, which are designed to reduce the cost of testing and to perform reliability screening, or burn-in, of complex logic devices, memory integrated circuits (ICs), sensors and optical devices. These systems can be used to perform parallel testing and burn-in of packaged ICs, singulated bare die or ICs still in wafer form.
More