Onto Innovation Inc. is engaged in the design, development, manufacture and support of metrology and inspection tools for the semiconductor industry. The Company’s products include Automated Metrology Systems; Integrated Metrology Systems; Silicon Wafer All-surface Inspection/Characterization; Macro Defect Inspection; Automated Defect Classification and Pattern Analysis; Yield Analysis; Opaque Film Metrology, and others. Its products are primarily used by silicon wafer manufacturers, semiconductor integrated circuit fabricators, and advanced packaging manufacturers operating in the semiconductor market. The Company’s products are also used for process control in a number of other specialty device manufacturing markets, including light-emitting diodes, vertical-cavity surface-emitting lasers, micro-electromechanical systems, CMOS image sensors, silicon and compound semiconductor power devices, analog devices, RF filters, data storage, and certain industrial and scientific applications.